SEMATECH Advanced Technology Development Facility SVTC Technologies ISMI Pike Powers Mary Gibbons Natrella Japan Electronic Industries Development Association Nelson rules List of materials-testing resources Jack Kuehler National Alliance for Advanced Transportation Battery Cell Manufacture Sema (disambiguation) Run chart Chris Mack (scientist) Karen Gleason Semiconductor fabrication plant C-chart Veronica Czitrom Process capability Seasonal subseries plot LSI Corporation Peter C. Schultz JEIDA memory card X̅ and R chart Defects per million opportunities Robert Palmer (computer businessman) Bartlett's test Statistical graphics Steve Appleton Willis Adcock Muhammad M. Hussain P-chart J. J. Pickle Statistical dispers…

sion Plackett–Burman design Mask shop Process capability index Regression validation X̅ and s chart Additive disequilibrium and z statistic Shewhart individuals control chart Seasonality Radar chart ISO/TC 176 Mary Ellen Weber Microelectronics and Computer Technology Corporation Process window index Observational study Histogram Contrast (statistics) Gil Amelio Tukey's range test Kenneth L. Schroeder Berkeley Research Group Glossary of experimental design Through-silicon via Desorptive capacity Karen R. Hitchcock Tolerance inte

rval Photomask NASA ERAST Program Exponential smoothing Statistical process control Plot (graphics) Tokyo Electron Local regression Design of experiments Binomial distribution High-temperature operating life Absorptive capacity Moving average Wally Rhines ASML Holding Glossary of probability and statistics Tech Valley Sample size determination Control chart Wafer (electronics) Poly(phthalaldehyde) Oregon Graduate Institute Traitorous eight Electron-beam lithography Metrology Cyc Pearson's chi-squared test Evan Mecham History of Austin, Texas Extreme ultraviolet lithography Exponential distribution Analysis of variance Rochester Institute of Technology Three-dimensional integrated circuit Data analysis Poisson distribution Beta distribution